ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ

Optical System: Infinity-corrected optical system with chromatic correction, 45 mm optical path length
Trinocular Viewing Head: Infinity-corrected hinged trinocular viewing head; interpupillary distance adjustable from 50 to 75 mm; ±5 diopter adjustment on one eyepiece; two-position light split ratio: R:T = 100:0 or 0:100
Eyepieces: High eyepoint wide-field plan eyepiece, SWH10X23 mm (diopter adjustable)
Objectives: Brightfield metallurgical objectives (5X, 10X, 20X, 50X, 100X); 5XNA0.15WD12.10XNA0.30WD16.20XNA0.40WD12.50XNA0.55WD8.5; 100XNA0.8WD2.1 (100X optional)
Frame: Equipped with polarizer slot, featuring high intensity memory function
Objective Revolver: 5-position coded brightfield objective revolver; integrates microscope hardware setup with Omex image analysis software; magnification displayed on screen; calibration values automatically adjusted when changing magnification to avoid measurement errors
Coarse and Fine Focusing Mechanism: Low-position coaxial coarse and fine focusing mechanism; coarse focusing travel 9 mm; upward movement 6.5 mm; downward movement 2.5 mm; fine focusing precision 0.002 mm; tightening adjustment knob included to prevent slipping
Stage: Double-layer mechanical moving stage; platform size 215 mm × 165 mm; low-position coaxial X and Y axis adjustments; travel range 45 mm × 35 mm
Camera Interface: Photography and imaging accessory; 0.5X C-mount; adjustable focus
Imaging System: 4K high-definition imaging system; USB 3.0 desktop imaging system; equipped with cameras (5 MP, 6 MP, 12 MP, 20 MP, etc.)
Other Accessories: High-precision micrometer with graduated scale of 0.01 mm; professional software including measurement system, metallographic analysis system, particle analysis system, porosity analysis system, weldline-specific measurement system, etc.
Designed for materials education, routine applications, and fundamental metallographic research in laboratories. The superior optical system, paired with a wide-field flat-field eyepiece, enables students to observe the finest details in metallographic and materials analysis. The user-friendly coarse and fine coaxial focusing mechanism ensures students can focus on the experiment itself. Its compact design allows for easy storage, saving laboratory space, and it is suitable for brightfield observation, meeting the needs of daily teaching and laboratory applications. Brightfield / Encoding / Light Intensity Memory / Polarization (optional).