Santec TMS-2000 ລະບົບແຜນທີ່ຄວາມຫນາ Wafer (1 nm)
1. High Accuracy
High accuracy measurement using interferometric detection technique (1 nm repeatability)
2. Industry Standard Parameters
Analysis of Global (GFLR, GFLD, GBIR), Site (SFQR, SFQD, SBIR), Edge (ESFQR) possible
3. High Environmental Resistance
No temperature control or vibration countermeasures are required due to environmental durability
Small form factor suitable for multiple applications
4. Compact Size
Analysis Software
Thickness Measurement Site Analysis Edge Analysis
5. High Speed
Spiral Scanning (High speed, high density)
Note: Customers are advised to carefully read the Datasheet to select the correct ordering code that meets their usage requirements.
ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ