ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
Technical parameters
Frequency range: 7 MHz ... 3 GHz
Resolution: 65 µm
Electrode surface area: (150 x 35) µm
Scope of delivery
1x ICR E150, Near-Field Microprobe E-field 7 MHz to 3 GHz
1x BT 706, Bias Tee for Langer probes
1x SMA-SMA RA, Cable SMA-SMA, right angle
1x ICR-C, ICR Certificate
1x ICR Corr, Correction Curves ICR / USB
1x NT FRI EU, Power Supply Unit
1x ICR case1, System Case
Short description
The near-field microprobe is designed for a high-resolution measurement of electrical near fields. With the ICR E probe the following measurements can be performed:
Surface Scan via IC according to IEC 61967-3
Volumenscan via IC
Pin Scan
The measuring electrode at the ICR RF probe head is horizontally aligned to the measurement surface.
A preamplifier is integrated into the probe housing and powered by the Bias-Tee.
The ICR near-field probes undergo a quality check before they are delivered. Different reference setup measurements are performed and resulting correction lines are generated. Two different correction lines are determined – a standardized correction line and an E-field correction line.
Attention: Due to its construction, the ICR probe is sensitive to shock and comes with a protective cap for transport and handling.
Datasheet
Overview
