JINKO JK2828 ຂົວດິຈິຕອນ LCR ຄວາມແມ່ນຍໍາສູງ (20 Hz－1MHz)

Test frequency: 20 Hz－1MHz, 0.01Hz resolution

Test parameter: |Z|, |Y|, C, L, X, B, R, G, D, Q, θ, DCR

Basic test accuracy: 0.05%

Equivalent circuit: Series, parallel

Mathematical function: Absolute value deviation, percentage deviation

Range mode: Auto, Hold, manual

Trigger mode: Internal, Manual, External, Bus

Measurement speed (≥1kHz):

Fast: 75 times/second

Medium: 12 times/second

Slow: 3 times/second

Averaging rate: 1—255

Delay time: 0—60s, 1 ms step by step

Correction function: Open, short, load

List sweep: 10 points

Display mode: Direct, Δ, Δ%, V/I (V/I monitor)

Display: 800×480 RGB 7 inch 16:9 TFT LCD display

Test signal: Output impedance: 30 Ω, 50 Ω, 100 Ω, 10/CC selectable

Test level:

Normal: 5mV－2V Accuracy: 10%, with step of 1 mV

Constant level: 10mV－1V Accuracy: 5%, with step of 1 mV

DC bias source:

Interior: 0V, 1.5V, 2V Accuracy: 1%

Optional: ±5V (±100mA) DC bias source

Optional: 1A: 0-1A DC bias current source

Display range:

|Z|, R, X: 0.01mΩ — 99.9999 MΩ

DCR: 0.001 mΩ — 99.9999 MΩ

|Y|, G, B: 0.00001µS — 99.9999S

C: 0.00001pF — 9.9999F

L: 0.00001µH — 9999.99H

D: 0.00001 — 9.9999

Q: 0.00001 — 9999.9

θ (DEG): -179.999º — 179.999º

θ (RAD): -3.14159 — 3.14159

Comparator function: 10 bins: 9 pass bins, 1 fail bin, AUX bin

Multiparameter: Four parameters can be chosen optionally to measure and display at the same time

Curve scanning function: A variety of test conditions, the piece to be measured for graph scanning separation

Memory: Internal storage, USB extended storage

Interface:

Standard: RS232C, HANDLER, USB HOST, USB DEVICE, headphone jack, Solid interface

Optional: GPIB, LAN

Dimensions: 375mm (W) * 135mm (H) * 350mm (L)

Weight: About 7 kg

Brief Introduction:

JK2828 high precision digital bridge is a multifunctional element parameter tester for various electronic components inspection. It features a 7-inch 800 x 480 color TFT LCD display, high speed and stability, with a frequency range of 20 Hz – 1 MHz and an accuracy of 0.05%. The JK2828 is used for incoming inspection of components, product line quality control, goods inspection, and laboratory measurement requirements.

Features:

■ Brand new 32-bit processor core, data comparable to first-class foreign equipment

■ 7 inch true color TFT screen

■ 20 Hz — 1 MHz test frequency

■ 0.05% basic measurement accuracy, fast test (75 times/sec)

■ Graphics scanning analysis function, supports level/frequency/offset scan, provides insight into the feature to be tested

■ Multi-parameter testing capabilities

■ Automatic level control (ALC) for test voltage or current

■ Signal source output impedance: 30 Ω, 50 Ω, 100 Ω, 10/CC

■ Built-in comparator with 10 bins and bin counters

■ 10 spots list sweep function

■ Internal 100 group set file, 500 U disk test files can be saved or invoked

■ Internal DC bias voltage: 0V, 1.5V, and 2V

■ Optional ±5V (±100mA) and 1A internal DC bias source

■ Upgradeable and updateable via U disk for instrument software version

■ U disk print screen, real-time data save, supports FAT16, FAT32 file systems

■ Standard configuration: RS232C, USB HOST, USB DEVICE, HANDLER, Headphone Jack, Footswitch Jack

■ Optional: GPIB, LAN