ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
Coating layer analysis:
+ Elemental analysis range: Li (3)-U (92)
+ Detection limit: 0.005µm
+ Content analysis range: 0.01-80μm (detection limit for different elements is different) 0.1μm (<1pm thin outer coating)
+ Repeatability: 0.1pm (<1pm thin outer coating)
+ Stability: 0.1pm (<1pm thin outer coating)
Composition analysis
+ Elemental analysis range: S (16)-U (92)
+ Detection limit: 2ppm
+ Content analysis range: 2ppm-99%
+ Repeatability: 0.1%
+ Stability: 0.1%
EFP alaorithm: standard configuration
Measuring time: 5-300s
Detector: Si-Pin semiconductor detector
X-ray source: micro-focusing X-ray tube
Collimator: Standard: Φ0.3mm (Φ0.5mm, Φ0.3mm, Φ0.2mm, 0.1×0.3mm) four collimators optional, customized acceptable
Spot diffusivity: <10%
Camera: 1/2.7 color CCD, zoom function
Measure distance: zoom lens 0-30mm
Focus method: high-sensitivity lens, manual focus
Enlargement factor: optical magnification 38-46X, digital magnification 40-200X
Max sample height: 210mm
XY stage: manual high-precision XY stage
Available moving range: 50mmx50mm
Operating environment: 15-30°C, <70%RH
Power: AC220V, 50Hz, 95W
Dimension (LxWxH):545x380×435mm
Weight: 48kg
STANDARD DELIVERY
Main unit: 1pc
Computer: 1pc
Printer: 1pc
Accessory box: 1pc
Twelve element plate: 1pc
Standard plate: 2pcs*
OPTIONAL DELIVERY
Electroplating solution measuring cup: XRF-PT230-MC
Solution Test Membrane: XRF-PT230-SF
