ESi EDX8000T Plus ເຄື່ອງວິເຄາະຄວາມໜາຂອງເຄືອບ XRF

Instrument Size:520mm*400mm*450mm

Sample Chamber Size：430mm*370mm*210mm

Weight: 35Kg

Element Range：Mg12-U92

Content Range：1ppm- 99.99%

LOD：0.005μm,up to five layers

Detector ：High resolution Peltier Cooling SDD Detector(FSDD Optinal)

DPP Analyzer: 4096 Channels

X-Ray Tube：50W Micro focus tube

Measuring directions：Bottom up

Collimator：Auto selection of Φ0.15mm,Φ0.2mm,Φ0.3mm,Optional 0.1*0.2mm

X-ray Generator：0-50KV

Power supply：220ACV 50/60HZ

High precision sample platform：

Manual XY table：80mm*80mm

Simple and accurate positioning of the sample by hand

Working Environment：-10 °C to 35 °C

Features

Positioning of the measuring point on small structures thanks to automatic image recognition

The software is equipped with distance correction algorithm, which enables accurate testing of irregular samples (such as concave and convex surfaces, threads, curved surfaces, etc.)

Adoption of closed housing greatly minimizes the risk of x-ray leakage.

Easy operation enabled with simple interface and help function of the software

Daily routine measurements can be conducted easily by using registered application-Curve recipe.

Common Coating Thickness Applications Include:

- Single Layer Coatings; one metal coating (Zn, Ni, Cr, Cu, etc) over a substrate

- Binary Alloy Coatings

- Multiple Layer (multilayer) Coatings; two or more layers over a substrate (Cr/Ni/Cu)

- common applications in electronics are ENIG and ENEPIG per IPC 4552 and IPC 4556

- Composite coatings over a substrate (AuNi/Cu and ZnNi/Cu)

- composition of the alloy coating can be identified as well

- Thin film measurements (ie wafer fab quality control in semiconductor industry)

- Solution analysis of plating baths

- Measurement methods according to ASTM standards when applicable