ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
Instrument Size:520mm*400mm*450mm
Sample Chamber Size：430mm*370mm*210mm
Weight: 35Kg
Element Range：Mg12-U92
Content Range：1ppm- 99.99%
LOD：0.005μm,up to five layers
Detector ：High resolution Peltier Cooling SDD Detector(FSDD Optinal)
DPP Analyzer: 4096 Channels
X-Ray Tube：50W Micro focus tube
Measuring directions：Bottom up
Collimator：Auto selection of Φ0.15mm,Φ0.2mm,Φ0.3mm,Optional 0.1*0.2mm
X-ray Generator：0-50KV
Power supply：220ACV 50/60HZ
High precision sample platform：
Manual XY table：80mm*80mm
Simple and accurate positioning of the sample by hand
Working Environment：-10 °C to 35 °C
Features
Positioning of the measuring point on small structures thanks to automatic image recognition
The software is equipped with distance correction algorithm, which enables accurate testing of irregular samples (such as concave and convex surfaces, threads, curved surfaces, etc.)
Adoption of closed housing greatly minimizes the risk of x-ray leakage.
Easy operation enabled with simple interface and help function of the software
Daily routine measurements can be conducted easily by using registered application-Curve recipe.
Common Coating Thickness Applications Include:
- Single Layer Coatings; one metal coating (Zn, Ni, Cr, Cu, etc) over a substrate
- Binary Alloy Coatings
- Multiple Layer (multilayer) Coatings; two or more layers over a substrate (Cr/Ni/Cu)
- common applications in electronics are ENIG and ENEPIG per IPC 4552 and IPC 4556
- Composite coatings over a substrate (AuNi/Cu and ZnNi/Cu)
- composition of the alloy coating can be identified as well
- Thin film measurements (ie wafer fab quality control in semiconductor industry)
- Solution analysis of plating baths
- Measurement methods according to ASTM standards when applicable
