ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
- Instrument Specifications
Size of Spectrometer: 560mm*380mm*410mm
Size of sample chamber：460mm*310mm*95mm
Weight: 45Kg
Element Range：Na11-U92
Analysis content range：1ppm- 99.99%
Detector：AmpTek high resolution Fast SDD
DPP Analyzer: 4096 Channel DPP analyzer
Excitation Source：High performance US made X-ray tube
HV unit：0-50kV adjustable
Power supply：220ACV 50/60HZ
Environment：-10 °C to 35 °C
Accessory
- Standard
Au- Calibration standard
Ring holder
Sample cup for liquid
USB cable
Power supply cable
Test Mylar
Calibration report
Warranty card
- Optional
Power stabilizer
Precious Metal standard samples
Features
- Large sample chamber with the best performance Fast Silicon Drift Detector
- Outstanding sensitivity leads to up to a factor 3 improved precision – the basis for high accuracy when analyzing minor to major element concentrations.
- World's fastest XRF analyze–highest accuracy within the shortest measurement time, excellent precision
- High-count throughput detection system result in significantly (typically a factor 3) lower limits of detection for a wide range of elements.
- Easier, faster, more accurate than nitric acid test methods.
- Faster, more comprehensive analysis than fire assay, with comparable accuracy.
- Measure the content of all gold and precious metals without manually changing the calibration.
- Precisely determine the presence and concentration of other trace alloying elements and dangerous heavy elements, which could impact valuation and future refining needs.
- Friendly user interface, customizable analysis report, one-click printing test report, including analysis result, sample information, spectrum information and sample image
- Eight kinds of light path collimation systems, automatically switch according to different sample sizes, and can also test different positions of the sample and then calculate the average value to reduce the error caused by the unevenness of the sample
- High-definition built-in camera, which clearly shows the sample location detected by the instrument
