ESi EDX-9000A PLUS ເຄື່ອງວັດແທກ XRF ແບບສະເປກໂຕຣມິເຕີ (Na (11) – U (92))

- Instrument Specifications

Size of Spectrometer: 560mm*380mm*410mm

Size of sample chamber：460mm*310mm*95mm

Weight: 45Kg

Element Range：Na11-U92

Analysis content range：1ppm- 99.99%

Detector：AmpTek high resolution Fast SDD

DPP Analyzer: 4096 Channel DPP analyzer

Excitation Source：High performance US made X-ray tube

HV unit：0-50kV adjustable

Power supply：220ACV 50/60HZ

Environment：-10 °C to 35 °C

Accessory

- Standard

Au- Calibration standard

Ring holder

Sample cup for liquid

USB cable

Power supply cable

Test Mylar

Calibration report

Warranty card

- Optional

Power stabilizer

Precious Metal standard samples

Features

- Large sample chamber with the best performance Fast Silicon Drift Detector

- Outstanding sensitivity leads to up to a factor 3 improved precision – the basis for high accuracy when analyzing minor to major element concentrations.

- World's fastest XRF analyze–highest accuracy within the shortest measurement time, excellent precision

- High-count throughput detection system result in significantly (typically a factor 3) lower limits of detection for a wide range of elements.

- Easier, faster, more accurate than nitric acid test methods.

- Faster, more comprehensive analysis than fire assay, with comparable accuracy.

- Measure the content of all gold and precious metals without manually changing the calibration.

- Precisely determine the presence and concentration of other trace alloying elements and dangerous heavy elements, which could impact valuation and future refining needs.

- Friendly user interface, customizable analysis report, one-click printing test report, including analysis result, sample information, spectrum information and sample image

- Eight kinds of light path collimation systems, automatically switch according to different sample sizes, and can also test different positions of the sample and then calculate the average value to reduce the error caused by the unevenness of the sample

- High-definition built-in camera, which clearly shows the sample location detected by the instrument