ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ
Test Space: 100 x 100 x 90 cm
Max Capacity: 5000kg(50kN)
Units:
Force： gf, kgf, lbf, N, kN, ozf, tonf(SI), ton(long), tonf(short)
Pressure： Kpa, Mpa, psi, bar, mm-Aq, mm-Hg
Force Resolution: 31 bits
Force Precision: 1/100,000
Stroke Resolution: 0.0001mm
Test Speed: 0.2~300 mm/min (digital DIP Switch)
Hardware Protection: Upper/ Lower limit, Emergency stop button
Motor Type: Servo motor
Data sample rate: 1200 hz (Max.)
Connect to PC: RJ45(TCP/IP)
Power Phase: Single Phase 200~240VAC，5A
Dimension: 176 x 100 x 178 cm
Weight: 850 kg
Software functions
1. Data sample rate faster can be set up to 1200 Hz
2. Operation method: By keyboard and mouse control test, can also through up and down button to adjust the fixture position
3. Compatible with Window 7 /8 system
4. Software has multi-languages with Chinese, English, Japanese, Korean and Spanish display
5. Operating mode: TCP / IP interface, two-way transmission, the computer directly control the machine action
6. Can import multiple test data display simultaneously.
7. Unit selection can be Metric unit and Imperial units.
8. Form flexibility, self-planning information analysis.
9. Data name can be self-set and can self-defined formula
10. Test Screen can be selected data display, graphic display or simultaneous display
11. Data processing: store, call, list, statistical comparison, etc.
12. Graph X-Y axis physical quantity adjustment, graph-specific mark, interval mark, slope and son on.
13. Test tensile, compression, bending, peeling, spring, creep and other tests
14. Software protection: Overload, over -displacement, over-time protection
15. Variety of test actions, ex. reciprocation, creep, hold tensile (compression), test pause, slip test, etc.
16. Modularization of specimen setting, providing easy to set specimen.
17. Modularization of test conditions to reduce artificial setting negligence and error.
18. Key data capture, can set the upper and lower limits of test data specifications
19. Support multiple sets of I / O signals, increase testing mechanism
