Bettersize Bettersizer S3 Plus ການວິເຄາະຂະຫນາດຂອງອະນຸພາກ (0.01 - 3500 μm)
Parameter Measured
Particle size distribution & Particle shape: Suspension, emulsion, dry powders
General
Principle: Laser diffraction and dynamic image technologies
Analysis: Mie scattering theory and Fraunhofer diffraction theory
Typical measurement time: Less than 10 seconds
Measurement Performance
Measuring range:
0.01 - 3500 μm (Laser System)
2 - 3500 μm (Image System)
Accuracy: <0.5% (NIST certified standards)
Repeatability: <0.5% (NIST certified standards)
Number of size classes: ≤100 (adjustable)
Feeding mode: Automatic circulation or semi-automatic circulation
Special functions: Refractive index measurement, SOP settings
Image recognition: Up to 120 fps, up to 10,000 particles per min
Main Device
Optical system: Patented DLOI (Dual Lenses & Oblique Incidence) System
Laser: Polarized light-pumped solid-state laser (10 mW / 532 nm)
Detector: 96 detectors (forward, lateral and backward arrangements)
Measuring angle: 0.02 - 165°
CCD cameras: 0.5x and 10x *
Image analysis: 1.5 megapixels
Dispersion Module
Circulation speed: 300 - 2500 r/min
Circulation flow rate: 3000 - 8000 mL/min
Ultrasonication: Dry run protection, Max 50 W (adjustable)
Circulation tank capacity: 600 mL
Software
Conformity: 21 CFR Part 11, ISO 13320, ISO 13322, USP <429>
Report: Customizable reporting
System Parameters
Dimensions (L x W x H): 820 × 610 × 290 mm
Weight 48 kg
Voltage: DC 24 V, 50 / 60 Hz, 20 W
Computer Configuration (Recommended)
Computer interface: At least one high-speed USB 2.0 or USB 3.0 port required
Operating system: Windows 7 / Windows 10
Hardware specification Intel Core i7, 8GB RAM, 500GB HD, two PCI-E X16 interfaces
Features and Benefits
● Measuring range is 0.01 - 3,500μm (laser system), 2 - 3,500μm (image system)
● Combining laser diffraction and dynamic image analysis in one instrument, obtaining size and shape results simultaneously
● Patented DLOI (Dual Lenses & Oblique Incidence) system enable the measurement of ultrafine particles down to 0.01 um
● Dual-camera imaging technology can show particles images in real time and detect oversized particles up to 3500 um
● Refractive index measurement determines the refractive index of unknown samples and improves te reliability of results
● Compliance with 21 CFR Part 11, ISO 13320, USP <429>, CE
Brochure
Video
ຮັບສ່ວນຫຼຸດພິເສດຕາມປະລິມານ, ອັບເດດລາຄາຂາຍສົ່ງ ແລະ ການແຈ້ງເຕືອນສິນຄ້າໃໝ່ສົ່ງກົງເຖິງອິນບັອກຂອງທ່ານ.
ໂດຍການສະໝັກສະມາຊິກ, ທ່ານຍອມຮັບ ເງື່ອນໄຂການໃຫ້ບໍລິການ ແລະ ນະໂຍບາຍຄວາມເປັນສ່ວນຕົວ ຂອງພວກເຮົາ.
ເຂົ້າເຖິງຜູ້ຊ່ຽວຊານທີ່ໄດ້ຮັບການຢັ້ງຢືນຂອງພວກເຮົາໂດຍກົງ